Download Analog Layout Generation Performance and Manufacturability by Koen Lampaert PDF

By Koen Lampaert

Analog built-in circuits are extremely important as interfaces among the electronic components of built-in digital platforms and the open air international. a wide component to the hassle enthusiastic about designing those circuits is spent within the structure part. while the actual layout of electronic circuits is automatic to a wide quantity, the format of analog circuits continues to be a guide, time-consuming and error-prone job. this is often in most cases a result of non-stop nature of analog indications, which motives analog circuit functionality to be very delicate to format parasitics. The parasitic components linked to interconnect wires reason loading and coupling results that degrade the frequency behaviour and the noise functionality of analog circuits. machine mismatch and thermal results positioned a basic restrict at the a possibility accuracy of circuits. For profitable automation of analog format, complex position and path instruments that could deal with those serious parasitics are required.
some time past, computerized analog structure instruments attempted to optimize the format with no quantifying the functionality degradation brought by means of format parasitics. for this reason, it used to be no longer assured that the ensuing structure met the necessities and a number of format iterations may possibly be wanted. In Analog format new release for functionality and Manufacturability, the authors suggest a functionality pushed format technique to triumph over this challenge. during this technique, the format instruments are pushed via functionality constraints, such that the ultimate format, with parasitic results, nonetheless satisfies the requirements of the circuit. The functionality degradation linked with an intermediate structure answer is evaluated at runtime utilizing predetermined sensitivities. by contrast with different functionality pushed structure methodologies, the instruments proposed during this ebook function at once at the functionality constraints, with no an intermediate parasitic constraint iteration step. This strategy makes a whole and good trade-off among the several structure choices attainable at runtime and consequently removes the prospective suggestions path among constraint derivation, placement and structure extraction.
along with its effect at the functionality, structure additionally has a profound effect at the yield and testability of an analog circuit. In Analog Layout new release for functionality and Manufacturability, the authors define a brand new criterion to quantify the detectability of a fault and mix this with a yield version to evaluation the testability of an built-in circuit format. They then combine this system with their functionality pushed routing set of rules to supply layouts that experience optimum manufacturability whereas nonetheless assembly their functionality necessities.
Analog structure iteration for functionality and Manufacturability could be of curiosity to analog engineers, researchers and scholars.

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18(a) and Fig. 18(b) for an n-channel FGMOS. Both techniques suffer from the same drawback: the gate voltage must not exceed the rail by more than the cut-in voltage of the p-n body–source junction of the nMOS transistor realising Rleak , so that it does not become forward biased. 18 (c) (c) (a) Implementation of the quasi-FGMOS proposed in [131] (b) Implementation of the quasi-FGMOS proposed in [132] (c) Wide range quasi-FGMOS improves the input range is illustrated in Fig. 18(c) using an n-channel FGMOS transistor.

All these facts increase the risk of failure in certain topologies, and is critical in those analog cells that have to work with reduced voltage margins, such as, for example, the low voltage circuits described along this book. Circuits operating in the subthreshold region are also very much affected by the variation of the parasitic capacitances since this variation will have an exponential effect. A very important consequence of an incorrect estimation of CGD is the miscalculation of the output resistance (see eq.

Ic. 01 1 1 2 4)]. In subsequent simulations the final value of the DC bias (‘a’ parameter in v1) is set to different values thus performing the parametric variations. The input–output characteristics obtained with these simulations are shown in Fig. 9. Netlist for the circuit in Fig. 9 1 V2(V) 2 Input–output characteristic for the FGMOS inverter in Fig. end The ITA technique is even easier to apply if the Spectre simulator is used in Cadence to design the circuit [125]. In this case the input file does not need to be modified to perform an AC simulation.

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